Fabien has been presenting his new work on sequential plan-view TEM analysis of porous GaN at PICO2021.
Kick-off #PICOO2021 conference on Frontiers of Aberration Corrected Electron Microscopy.— Fabien Massabuau (@FabienMassabuau) May 3, 2021
Join on Tue 10am (GMT) for my talk on sequential PV TEM. On the menu:
– Dislocations and pores
– Religious devotion to sample preparation
– Pretty pictures!https://t.co/xdcfcPXkpx pic.twitter.com/H2KY84ikCP